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We present a comprehensive and automated methodology for processing two-dimensional X-ray diffraction (2D-XRD) patterns. The proposed workflow involves three sequential stages: (i) precise localization of the diffraction center, (ii) removal of high-frequency noise, and (iii) suppression of non-physical background signals. This method enables improved data quality for subsequent quantitative analysis such as radial integration, phase identification, and structural refinement. Application to experimental datasets from both the Synchrotron Radiation Facility and a table-top X-ray diffractometer demonstrates the method’s robustness, accuracy, and computational efficiency.